Применение метода GIXRD для исследования нарушенных слоев в керамиках NaNd(WO_4)-=SUB=-2-=/SUB=- и NaNd(MoO_4)-=SUB=-2-=/SUB=-, подвергнутых облучению высокоэнергетическими ионами

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چکیده

The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO4)2 and NaNd(MoO4)2 ceramics irradiated with high-energy ions. possibilities applicability limits the for analysis such samples are shown. Estimates degree amorphization near-surface given depending on irradiation dose. higher resistance external radiation exposure as compared has been demonstrated.

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ژورنال

عنوان ژورنال: ?????? ??????????? ??????

سال: 2022

ISSN: ['0044-4642', '1726-748X']

DOI: https://doi.org/10.21883/jtf.2022.08.52774.69-22